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Title:
METHOD FOR MEASURING STRESS/STRAIN
Document Type and Number:
Japanese Patent JPH09264801
Kind Code:
A
Abstract:

To accurately obtain the stress/strain near the inside surface of an sample by obtaining, based on measurement, at least one of the stress and strain near the exposed inside surface of a solid sample.

Firstly, an inside surface 2 of a solid sample 1 is exposed. Then, with the use of a laser Raman spectrum analysis, a Raman shift amount or a Raman scatter intensity, or bath of them near the exposed inside surface are measured, and based on thus obtained Raman shift amount or Raman scatter intensity or bath of them, a stress distribution 3 near the exposed inside surface are obtained. Then, based on the measuring result, an elasticity analysis is performed with 3-demention stress simulation, so that a stress distribution 3a on the inside surface, before the inside surface 2 is exposed (before destruction), is obtained by calculation. Thus, the stress distribution in the depth direction of the sample 1 is accurately obtained.


Inventors:
YAGISHITA JUNJI
SAITO TOMOHIRO
USHIKU YUKIHIRO
Application Number:
JP7754996A
Publication Date:
October 07, 1997
Filing Date:
March 29, 1996
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
G01L1/24; G01N21/65; H01L21/66; (IPC1-7): G01L1/24; G01N21/65; H01L21/66
Attorney, Agent or Firm:
Takehiko Suzue