Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
METHOD FOR OBSERVING THIN SAMPLE
Document Type and Number:
Japanese Patent JP2001249124
Kind Code:
A
Abstract:

To provide a method for observing thin samples such that the cut plane of each of the thin samples continuously cut out of a sample block (biological samples or the like) can be relatively easily photographed in a continuous fashion.

A carrier tape 2 is covered on its surface with an adhesive. The carrier tape 2 is fed out of a feed roll 3, is passed above the sample block 10, and is drawn out onto the top of a frame 9. After the carrier tape 2 is stuck to the surface of the sample block 10, the surface part of the sample block 10 is thinly cut by a cutter 1. The thin samples 11 cut out are held on the carrier tape 2. After the carrier tape 2 is drawn out forward, the frame 9 is stuck to the surface of the carrier tape 2 at positions around the thin samples 11. The carrier tape 2 is cut on the outside of the frame 9 and the thin samples 11 are recycled, together with the frame 9. The frame 9 recycled is mounted in a microscope 20 to photograph its cut planes in a continuous fashion.


Inventors:
ISHIDA HISASHI
KOKUBO MITSUNORI
HIGUCHI TOSHIRO
KUDO KENICHI
Application Number:
JP2000059231A
Publication Date:
September 14, 2001
Filing Date:
March 03, 2000
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
TOSHIBA MACHINE CO LTD
KANAGAWA KAGAKU GIJUTSU AKAD
International Classes:
G01N33/48; G01N1/06; G01N1/28; G01N1/30; G01N33/483; G02B21/34; (IPC1-7): G01N33/48; G01N1/06; G01N1/28; G01N1/30; G01N33/483; G02B21/34
Attorney, Agent or Firm:
Takehiko Suzue (5 outside)