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Title:
METHOD FOR SPATIALLY RESOLVING AND DETERMINING MAGNETIC RESONANCE RELAXATION PARAMETERS IN EXAMINATION AREA RAPIDLY
Document Type and Number:
Japanese Patent JP2013223724
Kind Code:
A
Abstract:

To provide a rapid method of spatially resolving and determining magnetic resonance relaxation parameters in an examination area.

First, an examination area is irradiated with a preparation pulse. During the relaxation of longitudinal magnetization, spatially encoded magnetic resonance signals are acquired at at least two different inversion times by a fast magnetic resonance sequence. At each inversion time, an image data set is reconstructed from the magnetic resonance signals, and the image data sets are elastically registered. From the registered image data sets, values of magnetic resonance relaxation parameters are spatially accurately determined.


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Inventors:
ANDREAS GREISER
SCHMITT PETER
HUI XUE
Application Number:
JP2013085937A
Publication Date:
October 31, 2013
Filing Date:
April 16, 2013
Export Citation:
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Assignee:
SIEMENS AG
International Classes:
G01R33/48; A61B5/055
Domestic Patent References:
JP2013192578A2013-09-30
JP2001515736A2001-09-25
JP2005528974A2005-09-29
JP2008534044A2008-08-28
Foreign References:
WO2013140356A12013-09-26
US20110181285A12011-07-28
US20120078084A12012-03-29
Attorney, Agent or Firm:
Iwao Yamaguchi
Hiroshi Yamamoto



 
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