To provide an adhesive tape sticking method and an apparatus capable of accurately sticking an adhesive tape to a semiconductor wafer.
A protection tape supplied to the surface of a wafer W sucked and held by a holder is stuck to the surface of the wafer W while depressing the protection tape by a sticking roller, and simultaneously the surface height of the protection tape stuck to the surface of the wafer W is detected (step S3). The detection result is compared with a reference value of previously determined surface height (step S4). When both the values do not coincide with each other, the protection tape is peeled off, a foreign substance or the like existing on an interface between the wafer W and the adhesive surface is removed (step S5) and then a new protection tape is stuck to the surface of the wafer.
SAKATA MASANORI
YAMAMOTO MASAYUKI
NITTO SEIKI KK
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