Title:
METHOD AND SYSTEM FOR GENERATING PSEUDO FAULT
Document Type and Number:
Japanese Patent JP2978900
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To perform a fault processing test even concerning a secondary event after a primary event is generated.
SOLUTION: This pseudo fault generating system is provided with selector parts 1 and 5 for selecting a primary pseudo fault set to a pseudo fault event setting register 2a based on primary pseudo fault generation timing and selecting a secondary pseudo fault set to a pseudo fault event setting register 2b based on secondary fault generation timing, a primary pseudo fault generation timing generating part 3 for generating the said primary pseudo fault generation timing when the address of prescribed firmware is executed, a secondary pseudo fault generation timing generating part 4 for generating the said secondary pseudo fault generation timing when the prescribed primary pseudo fault is selected by the said selector part and an error processing part 6 for performing error processing concerning the pseudo fault selected by the said selector part.
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Inventors:
Amano, Yoshinobu
Application Number:
JP1998000225935
Publication Date:
September 10, 1999
Filing Date:
August 10, 1998
Export Citation:
Assignee:
NEC IBARAKI LTD
International Classes:
G06F11/22; (IPC1-7): G06F11/22; G06F11/22