To provide the manufacture information managing method of a cathode ray tube capable of preserving information related with one panel 11 in a data base 25 without overlapping it, and validly utilizing information preserved in a data base 25 for defect analysis.
The output of specific information 12 of each panel 11 and processing process information at the time of processing the panel 11 from processors 24a, 24b, and so on for processing the panel 11 is monitored. When the output of the specific information 12 and the processing process information from the processes 24a, 24b, and so on is confirmed, a series of the outputted specific information 12 and processing process information is preserved in a data base 25. A series of information related with one panel 11 is preserved in the data base 25 without being overlapped with each other, and the information preserved in the data base 25 is utilized for defect analysis.
ITO NAOYA
YAMADA HIROYUKI
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