Title:
METHOD AND SYSTEM FOR MEASURING SPECULAR SURFACE SHAPE OF ANTENNA
Document Type and Number:
Japanese Patent JP3537055
Kind Code:
B2
Abstract:
PURPOSE: To accurately measure the shape (deformation) of an antenna reflector on a satellite orbit in a wide range by receiving a signal scanned from an on-satellite antenna by a ground station, measuring an antenna radiation pattern and finding out specular surface shape of the antenna by calculation based upon the pattern.
CONSTITUTION: Antenna apecular surface shape measuring beams 22a, 22b reflected from an antenna main reflector 11 for the on-statellite antenna and scanned by an antenna sub-reflector for measuring the secular surface shape of the antenna are received by a ground station 23 for measuring the specular surface shape of the antenna. At the time, a communication beam is still fixed. A radiation pattern in antenna specular surface shape measuring frequency is processed by reverse Fourier transformation, its phase component is extracted and the shape of the antenna reflector can be found out by using the algorithm of a radio holography for finding out phase distribution on the aperture face of the antenna reflector. In this measurement, the antenna specular surface change is roughly measured in a wide range by using an antenna specular surface shape measuring signal having low frequency and the shape is measured at high resolution by using an antenna specular surface shape measuring signal having high frequency to secure prescribed accuracy.
Inventors:
Shimizu, Masafumi
Ueno, Kenji
Ueno, Kenji
Application Number:
JP3870894A
Publication Date:
June 14, 2004
Filing Date:
March 09, 1994
Export Citation:
Assignee:
NIPPON TELEGR & TELEPH CORP <NTT>
International Classes:
G01R29/10; H01Q1/28; H01Q19/12; H01Q19/18; (IPC1-7): H01Q19/12; G01R29/10; H01Q1/28; H01Q19/18
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