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Patent Searching and Data


Title:
集束粒子ビームを用いて基板を処理する方法及び装置
Document Type and Number:
Japanese Patent JP5930022
Kind Code:
B2
Abstract:
The invention relates to method for removing excessive material from a substrate (105), the method comprising the steps of: (a) depositing a removable material around the excessive material using a focused particle beam (127) and at least one deposition gas; and (b) removing the excessive material together with the removable material.

Inventors:
Brett Ristan
Spies petra
Hoffman Solsten
Application Number:
JP2014506858A
Publication Date:
June 08, 2016
Filing Date:
April 26, 2012
Export Citation:
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Assignee:
Carl Zeiss SGM Game Beher
International Classes:
G03F1/74; C23C16/48; G03F1/44; G03F1/84; H01J37/30
Domestic Patent References:
JP7122484A
JP10090876A
JP4050844A
JP11330209A
JP2006350219A
JP2004251964A
JP2006156179A
JP2010085778A
Attorney, Agent or Firm:
Koichi Tsujii
Sadao Kumakura
Fumiaki Otsuka
Takaki Nishijima
Hiroyuki Suda
Hiroshi Uesugi
Yoshinori Kishi