Title:
質量分析によりガスを検査するための方法および質量分析計
Document Type and Number:
Japanese Patent JP6734872
Kind Code:
B2
Abstract:
A method for examining a gas by mass spectrometry includes: ionizing the gas for producing ions; and storing, exciting and detecting at least some of the produced ions in an FT ion trap. Producing and storing the ions in the FT ion trap and/or exciting the ions prior to the detection of the ions in the FT ion trap includes at least one selective IFT excitation, such as a SWIFT excitation, which is dependent on the mass-to-charge ratio of the ions. The disclosure further relates to a mass spectrometer. A mass spectrometer includes: an FT ion trap; and an excitation device for storing, exciting, and detecting ions in the FT ion trap.
Inventors:
Ariman Michel
Laue Alexander
Chun Hin Yi Antony
Fedsenco Genergy
Reuters Ludiger
Galk Hover Leonite
Antoni Martin
Gors Andreas
Delpman Valery
Laue Alexander
Chun Hin Yi Antony
Fedsenco Genergy
Reuters Ludiger
Galk Hover Leonite
Antoni Martin
Gors Andreas
Delpman Valery
Application Number:
JP2017557937A
Publication Date:
August 05, 2020
Filing Date:
March 17, 2016
Export Citation:
Assignee:
Carl Zeiss SGM Gaehha
International Classes:
H01J49/00; G01N27/62; H01J49/38; H01J49/42
Foreign References:
| US4761545 | ||||
| WO2015003819A1 |
Attorney, Agent or Firm:
Shinichiro Tanaka
Disciple Maru Ken
Fumiaki Otsuka
Takaki Nishijima
Hiroyuki Suda
Naoki Kondo
Disciple Maru Ken
Fumiaki Otsuka
Takaki Nishijima
Hiroyuki Suda
Naoki Kondo