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Title:
MICROORGANISM INSPECTION SYSTEM
Document Type and Number:
Japanese Patent JP2004004006
Kind Code:
A
Abstract:

To provide a microorganism inspection system for determining the advisability of an inspection during the inspection and rapidly performing reinspection caused by interruption in process of an inspection or by a change of setting.

By this microorganism inspection system, microorganisms are photographed and the existence of microorganisms is inspected by image-processing photographed image data. The system has a measuring condition displaying means for urging the inputting of measuring conditions, such as an inspection specimen, inspection weight, diluted solution, a dilution rate, a pre-processing method, pre-processing time, an inspection kit, the number of times of scanning, a reference value, and calibration; a measurement start-displaying means for urging the execution of measurement; and an inspection status-displaying means for displaying a status during measurement or the results of inspection after the measurement. By the status displaying means, position displays are made so as to correspond to inspection areas for analyzing obtained images. As to the position displays, at least two section displays are made so as to correspond to inspection status, among a yet-to-be-measured section display, an in-process-of-measurement section display, a completed-measurement section display, an unmeasurable section display, and an unmeasured section display.


Inventors:
KINUGAWA AKINORI
NAKAJIMA HIROSHI
IBAYASHI MASARU
Application Number:
JP2003083015A
Publication Date:
January 08, 2004
Filing Date:
March 25, 2003
Export Citation:
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Assignee:
MATSUSHITA ECOLOGY SYS CO
International Classes:
G01N21/64; C12M1/34; C12Q1/04; G01N33/48; (IPC1-7): G01N21/64; C12M1/34; C12Q1/04; G01N33/48
Attorney, Agent or Firm:
Shimizu Yoshi Hiro
Shinichi Abe
Yuji Tsujida