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Patent Searching and Data


Title:
MICROSCOPE SYSTEM
Document Type and Number:
Japanese Patent JP2015197623
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a microscope system capable of preventing overlooking observation of a specimen when performing screening of the specimen in the case that a partial reading is conducted for image data generated by an imaging device.SOLUTION: A microscope system 1 includes: a moving amount calculation part 623 for calculating a moving amount moving a stage 101a and a moving direction by a stage driving part 101b; and a stage control part 101d for driving the stage driving part 101b on the basis of the moving amount and moving direction calculated by the moving amount calculation part 623 on the basis of a width of one pixel of an imaging element 31, magnifications of an objective lens 102 detected by a revolver detection part 103b, a zoom detection part 108a, and an adaptor unit 108, and a region partially displaying the image data obtained by the imaging element 3 set by a partial region setting part 622.

Inventors:
ARIGA NAOHIRO
Application Number:
JP2014076104A
Publication Date:
November 09, 2015
Filing Date:
April 02, 2014
Export Citation:
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Assignee:
OLYMPUS CORP
International Classes:
G02B21/00; G01N21/17
Domestic Patent References:
JP2013050594A2013-03-14
JP2012150252A2012-08-09
JP2014014006A2014-01-23
JP2013167898A2013-08-29
JP2013050594A2013-03-14
JP2012150252A2012-08-09
JP2014014006A2014-01-23
JP2013167898A2013-08-29
Attorney, Agent or Firm:
Hiroaki Sakai