Title:
OPTICAL-MODULE TEST APPARATUS AND MEASUREMENT METHOD OF OPTICAL MODULE CHARACTERISTICS
Document Type and Number:
Japanese Patent JP2003017789
Kind Code:
A
Abstract:
To measure and control the surface temperature or surface temperature distribution of an optical module accurately in the environment temperature test of the optical module.
The temperature at a specified site on the surface of an optical module 10 is measured with a radiation thermometer 40, and a temperature variable section 30 in contact with the optical module 10 is heated and cooled based on the measured temperature, thus controlling the site to specific temperature. Even in test specifications for defining optical-module surface temperature as the test temperature, the surface of the optical module is measured and controlled directly, thus achieving an accurate temperature sequence.
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Inventors:
ONO HARUYOSHI
BABA ISAO
BABA ISAO
Application Number:
JP2001198338A
Publication Date:
January 17, 2003
Filing Date:
June 29, 2001
Export Citation:
Assignee:
FUJITSU QUANTUM DEVICES LTD
International Classes:
G01M11/00; H01S5/00; G01J5/10; (IPC1-7): H01S5/00; G01J5/10; G01M11/00
Attorney, Agent or Firm:
Teiichi
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