PURPOSE: To obtain a parts handling device capable of the high-speed test by making use of the test station selection function of a test unit through the plural connecting mechanisms arranged in parallel.

CONSTITUTION: Integrated circuit 1 is sent by one unit to connecting mechanism 10 from storing container 2 through feed-out mechanism 20. Mechanism 10 consists of contact bar 11 featuring the switching action and blocking cylinder 12, and bar 11 is connected to test station 53 of the test unit via connecting line 13. When the integrated circuit is exhausted from mechanism 10, the new one is fed in immediately through mechanism 20. And mechanism 10 closes bar 11 to secure the conduction between circuit 1 and satation 53, and at the same time the test start signal is sent to control part 50 of the test unit from control part 40 of the handling device. The exactly same operation is carried out with other feed-out mechanism 20' and connecting mechanism 10'.