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Patent Searching and Data


Title:
POLISHING LIQUID FOR CMP AND POLISHING METHOD USING THE SAME
Document Type and Number:
Japanese Patent JP2013038211
Kind Code:
A
Abstract:

To provide a polishing liquid for CMP, which is capable of achieving both high uniformity and a high polishing speed in chemical mechanical polishing (CMP) of a silicon oxide film, and to provide a polishing method using the same.

The polishing liquid for CMP contains abrasive grains, a first additive, a second additive, and water. An organic compound satisfying predetermined conditions is blended as the first additive, and a saturated monocarboxylic acid is blended as the second additive. The method for polishing a substrate having a silicon oxide film on a surface thereof comprises a step of polishing the silicon oxide film by a polishing pad while supplying the polishing liquid for CMP between the silicon oxide film and the polishing pad.


Inventors:
YOSHIKAWA SHIGERU
OTA MUNEHIRO
TANAKA TAKAAKI
Application Number:
JP2011172867A
Publication Date:
February 21, 2013
Filing Date:
August 08, 2011
Export Citation:
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Assignee:
HITACHI CHEMICAL CO LTD
International Classes:
H01L21/304; B24B37/00; C09K3/14