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Title:
PRINT MASK MANUFACTURING METHOD
Document Type and Number:
Japanese Patent JP2005096400
Kind Code:
A
Abstract:

To provide a print mask manufacturing method capable of suppressing significant disruption in a print pattern due to low removal performance of a print material from a through hole while avoiding the disruption in the shape of a through hole due to irradiation of laser for half-etching processes.

When a material having a thickness of about 150 μm is used as a substrate 2, after a half-etching portion 3 is subjected to a laser processing, the substrate 2 is turned over, and laser is irradiated from the side opposite to the side used in a half etching processing so as to form through holes 4. On the other hand, when a material having a thickness of about 75 μm is used, the substrate 2 is irradiated with laser from the same side with the half-etching portion 3 and the through holes 4 at the same time.


Inventors:
KOBAYASHI TAKESHI
NAKAMURA SHOJI
YOKOYAMA TAKASHI
TANAKA EIJI
Application Number:
JP2004077697A
Publication Date:
April 14, 2005
Filing Date:
March 18, 2004
Export Citation:
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Assignee:
RICOH MICROELECTRONICS CO LTD
International Classes:
B41C1/14; B23K26/00; B23K26/382; B41C1/05; B41N1/24; (IPC1-7): B41C1/14; B23K26/00; B41C1/05; B41N1/24
Domestic Patent References:
JPH11129640A1999-05-18
JPH07156569A1995-06-20
JP2000168256A2000-06-20
JPH08238743A1996-09-17
JPH0313393A1991-01-22
JPH05147190A1993-06-15
JPH11320156A1999-11-24
JPH0781027A1995-03-28
JP2003204137A2003-07-18
JPH0627167U1994-04-12
JPS6163090A1986-04-01
Attorney, Agent or Firm:
Toshi Kuroda