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Patent Searching and Data


Title:
PROBE, PROBE CARD DEVICE, AND METHOD OF MANUFACTURING PROBE
Document Type and Number:
Japanese Patent JP2003215158
Kind Code:
A
Abstract:

To provide a probe in which deposit of an oxide film formed on the surface of an electrode part of an object to be measured is restrained to eliminate erroneous judgement, which is easy in maintenance, and which has a long life, and a manufacturing method thereof.

Molding dies 8a, 8b are prepared to pressure-mold one end part of a wire rod 2. A knife edge part 10 including a clearance part 9 for escaping a portion of the wire rod 2 compressed by pressurization to be extended is provided in the molding dies 8a, 8b. The one end part of the wire rod 2 is inserted between the molding dies 8a, 8b, and pressure is applied to the molding dies 8a, 8b to conduct pressurization-work to the one end part of the wire rod 2. The portion of the wire rod 2 compressed by the pressurization to be extended comes into the clearance part 9, and a probe with the prescribed shape of knife edge part formed in the one end part of the wire rod 2 is provided after the pressurization molding.


Inventors:
YOSHIDA MINORU
OHASHI SEIICHI
Application Number:
JP2002017920A
Publication Date:
July 30, 2003
Filing Date:
January 28, 2002
Export Citation:
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Assignee:
INNOTECH CORP
International Classes:
G01R1/067; G01R1/06; G01R1/073; H01L21/66; (IPC1-7): G01R1/067; G01R1/06; G01R1/073; H01L21/66
Attorney, Agent or Firm:
Fukami Hisaro (3 outside)