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Title:
PROBE FOR OPTICAL PROXIMITY FIELD EXCITATION SPIN POLARIZATION TYPE SCANNING TUNNELING MICROSCOPE
Document Type and Number:
Japanese Patent JP3442629
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a probe for an optical proximity field excitation spin polarization type scanning tunneling microscope, which offers efficient spin polarization by optical pumping resulting from excitation utilizing the polarization of an optical proximity field.
SOLUTION: The probe for an optical proximity field excitation spin polarization type scanning tunneling microscope has an excitation means to overlap two orthogonal evanescent waves 6 to generate a single-polarized optical proximity field striped at widths of the order of a 1/4 wavelength, and a conical semiconductor probe needle 2 placed with its symmetry axis aligned with the polarization axis of the optical proximity field. The excitation means offers efficient electron-spin polarization by optical pumping.


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Inventors:
Koichi Mugasa
Hirokazu Hori
Kazuo Kitahara
Application Number:
JP30842197A
Publication Date:
September 02, 2003
Filing Date:
November 11, 1997
Export Citation:
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Assignee:
Japan Science and Technology Agency
International Classes:
G01N37/00; G01Q60/10; G01Q60/16; G01Q60/18; G01Q60/22; (IPC1-7): G01N13/12; G12B21/04
Domestic Patent References:
JP9145724A
JP9280810A
JP943324A
JP62139240A
JP954101A
JP5180756A
JP510819A
JP8262253A
Attorney, Agent or Firm:
Mamoru Shimizu



 
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