Title:
PROCESSING DEVICE, PROCESSING METHOD, AND MANUFACTURING METHOD OF PATTERN SUBSTRATE
Document Type and Number:
Japanese Patent JP2010044310
Kind Code:
A
Abstract:
To provide a processing device and a processing method for easily and surely carrying out processing for a contaminant, and to provide the manufacturing method of a pattern substrate.
The processing device for carrying out processing for the contaminant 15 on a mask 10 where a pellicle film 12 is mounted via a pellicle frame 11 includes: a stage 21 on which the mask is placed; and a light source 23 for emitting infrared light to the mask placed on the stage via the pellicle film. Besides, a cooling means 27 for cooling the mask can be provided and water can be coagulated on the pattern surface of the mask.
More Like This:
Inventors:
KUSUSE HARUHIKO
SAKUMA JUN
TAKEHISA KIWAMU
KATO MASAYUKI
IWAGAYA TERUYOSHI
AMANO YUTAKA
SAKUMA JUN
TAKEHISA KIWAMU
KATO MASAYUKI
IWAGAYA TERUYOSHI
AMANO YUTAKA
Application Number:
JP2008209680A
Publication Date:
February 25, 2010
Filing Date:
August 18, 2008
Export Citation:
Assignee:
LASERTEC CORP
PRE TECH CO LTD
PRE TECH CO LTD
International Classes:
G03F1/62; G03F1/64; G03F1/82; H01L21/027
Attorney, Agent or Firm:
Ken Ieiri
Yasuhiro Iwase
Yasuhiro Iwase
Previous Patent: LASER IMAGE PROJECTING DEVICE
Next Patent: OPTICAL FILM, POLARIZING PLATE USING IT, AND LIQUID CRYSTAL DISPLAY DEVICE
Next Patent: OPTICAL FILM, POLARIZING PLATE USING IT, AND LIQUID CRYSTAL DISPLAY DEVICE