Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PROJECTOR FOR MEASURING THREE-DIMENSIONAL SHAPE, AND INSTRUMENT FOR MEASURING THREE-DIMENSIONAL SHAPE
Document Type and Number:
Japanese Patent JP2007155600
Kind Code:
A
Abstract:

To provide a projector for measuring a three-dimensional shape that can project an optical pattern in a large light amount without changing the position of the optical pattern even when performing changeover of the optical pattern.

The projector for measuring the three-dimensional shape comprises: a light source 12 for emitting light; a projection lens 56 for projecting the optical pattern toward a measuring object; and an optical path branching/changeover optical system for changing an optical path of light emitted from the light source 12 between the light source 12 and the projection lens 56 into either optical path out of two branched optical paths. The optical path branching/changeover optical system can change the optical path by moving a movable mirror 46. One optical path is provided with a pattern generation element for generating the optical pattern of a stripe pattern, and light passing through the optical path is the optical pattern of the stripe pattern to be projected from the projection lens 56. The other optical path is not provided with the pattern generation element, and light passing through the other optical path is projected from the projection lens 56 as the uniform optical pattern of illumination distribution.


Inventors:
MITSUMOTO DAISUKE
SUWA MASAKI
Application Number:
JP2005353544A
Publication Date:
June 21, 2007
Filing Date:
December 07, 2005
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G01B11/25
Attorney, Agent or Firm:
Masafusa Nakano