Title:
試料分析装置
Document Type and Number:
Japanese Patent JP6923161
Kind Code:
B2
Abstract:
To provide a sample analyzer with which it is possible to analyze a sample with a spatial resolution exceeding diffraction limits while unstained.SOLUTION: The sample analyzer comprises: an illumination unit 10 for irradiating a sample S with at least a portion of a plurality of illumination lights differing in wavelength via an objective lens 14 by spatial and temporal superimposition; a detection unit 50 for detecting a signal light generated from the sample S due to the irradiation of the sample S with the plurality of illumination lights; and a computation unit 100 for computing a correlation function in the time domain of output of the detection unit 50. At least one of the plurality of illumination lights differs from the other illumination lights in wavefront or polarization distribution. The detection unit 50 detects forward scattered light as a signal light that differs in wavelength from the plurality of illumination lights generated from the sample S.SELECTED DRAWING: Figure 2
Inventors:
Keiki Ikedaki
Hideaki Kano
Hideaki Kano
Application Number:
JP2017249741A
Publication Date:
August 18, 2021
Filing Date:
December 26, 2017
Export Citation:
Assignee:
Olympus Endo Technology America Inc.
University of Tsukuba
University of Tsukuba
International Classes:
G01N21/65; G02B21/06
Domestic Patent References:
| JP2016530570A | ||||
| JP2015072462A | ||||
| JP2010528010A |
Foreign References:
| US20100238438 | ||||
| WO2015151461A1 | ||||
| US20170248518 | ||||
| US20160077167 | ||||
| WO2011099269A1 | ||||
| WO2012127907A1 |
Attorney, Agent or Firm:
Kenji Sugimura
Mitsutsugu Sugimura
Groundwork Kenichi
Mitsutsugu Sugimura
Groundwork Kenichi