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Patent Searching and Data


Title:
SAMPLING PROBE FOR MICROARRAY READ OUT USING ELECTROSPRAY MASS SPECTROMETRY
Document Type and Number:
Japanese Patent JP2009133868
Kind Code:
A
Abstract:

To obtain samples from surface array spots having analytes by the automated sampling system and a method of analysis using an electronic spray.

The system includes at least one probe, the probe including an inlet for flowing at least one kind of eluting solvent to respective ones of a plurality of spots and an outlet for delivering the analyte away from the spots. An automatic positioning system is provided for translating the probe relative to the spot to permit sampling of any spot. An electrospray ion source having an input connected by fluidity to the probe receives the analyte and generates ions from the analyte. The ion source provides the generated ions to a structure for analysis to identify the analyte, preferably being a mass spectrometer. The probe can be a surface contact probe, where the probe forms an enclosing seal along the periphery of the array spot surface.


Inventors:
VAN BERKEL GARY J
Application Number:
JP2009053183A
Publication Date:
June 18, 2009
Filing Date:
March 06, 2009
Export Citation:
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Assignee:
UT BATTELLE LLC
International Classes:
G01N1/00; G01N27/62; G01N1/28; G01N33/53; G01N37/00; G01Q60/60; G01Q80/00; H01J49/04; H01J49/26; G01N35/00
Foreign References:
US5245185A1993-09-14
Attorney, Agent or Firm:
Hironobu Onda
Makoto Onda
Atsushi Honda
Miho Ikegami