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Patent Searching and Data


Title:
SCANNING PROBE MICROSCOPE
Document Type and Number:
Japanese Patent JP2000035394
Kind Code:
A
Abstract:

To realize automation and display easy to understand in the structural analysis of a high polymer.

The data of a scanning region of a predetermined range from STM(scanning tunnel microscope) 1 is taken in an image memory 3. The data of the first scanning region in the data of the scanning region is scanned while collated with the pattern group of a pattern memory part 7 by a pattern confirmation part 5. When the pattern group similar to the pattern group stored in a pattern memory part 7 is confirmed, this pattern group is converted into a symbolic mark to be stored. The original image is also stored. When there is a non-scanned region in an image memory 3, a next scanning region is scanned. When the scanning of the data of the image memory 3 is completed, a pattern confirmation image and a structural analysis result displaying the original image stored in the pattern confirmation part 5 and the stored symbolic mark in consideration of the phase coupling relation of the spatial arrangement of molecule constituting elements are displayed.


Inventors:
YANO AYUMI
Application Number:
JP20258598A
Publication Date:
February 02, 2000
Filing Date:
July 17, 1998
Export Citation:
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Assignee:
SHIMADZU CORP
International Classes:
G01B7/34; G01N37/00; G01Q30/04; G01Q60/10; G01Q60/24; G01Q80/00; (IPC1-7): G01N13/12; G01B7/34; G01N13/16
Attorney, Agent or Firm:
Noguchi Shigeo