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Title:
SCREENING APPARATUS AND METHOD FOR SEMICONDUCTOR LASER DEVICE
Document Type and Number:
Japanese Patent JP2004096030
Kind Code:
A
Abstract:

To solve the problem that, since two surface electrodes are formed with different wavelengths on an active layer, and a current flows to the both in a conventional screening method, it is impossible to carry out screening by choosing one of the wavelengths although it is necessary to screen for each active layer i.e., for each wavelength when screening a multiple wavelength semiconductor laser device having a plurality of stripes.

In a jig which screens the multiple wavelength semiconductor laser device having the plurality of stripes, a heat sink is formed by laminating a conductive electrode and a non-conductive material. Screening is carried out by choosing a laser of a desired wavelength and bringing the heat sink in contact with only the screening electrode out of a plurality of electrodes of the laser element which performs screening.


Inventors:
OSAKI HIROTO
TAMURA YOSHIKAZU
Application Number:
JP2002258544A
Publication Date:
March 25, 2004
Filing Date:
September 04, 2002
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
H01S5/00; H01S5/40; (IPC1-7): H01S5/00; H01S5/40
Attorney, Agent or Firm:
Fumio Iwahashi
Tomoyasu Sakaguchi
Hiroki Naito