Title:
SELF-CHECKING TYPE INTEGRATED CIRCUIT
Document Type and Number:
Japanese Patent JP3171239
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To decrease the unit price of manufacturing by achieving simplification and common configuration of circuits for detection of faults, thereby achieving small-scale, low power consumption and the reduction in designing man-hours, omitting externally mounted parts and achieving compact configuration and improvement in productivity at the same time.
SOLUTION: When power supply is connected to an LSI package 11 and the power is supplied, power feeding to a main function part 12 is supplied via a surrentvalue detecting part 13. The current-value detecting part 13 outputs the current value flowing to the main function part 12 to a defect detecting part 14. In the defect detecting part 14, the defect is discriminated by the value of current (the value converted into voltage) which is received from the current- value detecting part 13, and the defect detected signal is sent out.
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Inventors:
Shigenori Kariya
Application Number:
JP33458497A
Publication Date:
May 28, 2001
Filing Date:
December 04, 1997
Export Citation:
Assignee:
NEC
International Classes:
G01R31/28; H01L21/822; H01L27/04; G01R31/26; (IPC1-7): H01L27/04; G01R31/26; H01L21/822
Domestic Patent References:
| JP1266734A |
Attorney, Agent or Firm:
Nobuyuki Kaneda (2 others)
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