Title:
SEMICONDUCTOR DEVICE AND METHOD OF DETECTING DEFECTIVE TERMINAL POSITION
Document Type and Number:
Japanese Patent JP2007335482
Kind Code:
A
Abstract:
To easily detect a defective terminal without lowering manufacturing efficiency in terminals wherein fault is apt to occur or in all terminals necessary to be analyzed.
Different identification marks 340 are provided to connection terminals 302 of a semiconductor device. Thus, a defective terminal can be easily detected without lowering manufacturing efficiency in terminals wherein fault is apt to occur or in all terminals necessary to be analyzed.
COPYRIGHT: (C)2008,JPO&INPIT
Inventors:
SHINAGAWA MASATOSHI
Application Number:
JP2006162946A
Publication Date:
December 27, 2007
Filing Date:
June 13, 2006
Export Citation:
Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
G01R31/26; H01L21/02
Attorney, Agent or Firm:
Takao Itagaki
Yoshihiro Morimoto
Toshiji Sasahara
Yohei Harada
Yoshihiro Morimoto
Toshiji Sasahara
Yohei Harada