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Patent Searching and Data


Title:
SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JPH025187
Kind Code:
A
Abstract:

PURPOSE: To reduce manhour for the formation of a test program by providing the title device with a specification changing information ROM part for storing the specification changing information of a specification changeable internal circuit, and at the time of testing or inspecting the operation, performance, etc., of the internal circuit, outputting specification changing information from the ROM part to the external.

CONSTITUTION: A control part 7 controls the operation of respective parts including a user ROM part 4 and the specification changing information ROM part 5, and when the ROM part 5 is selected, outputs specification changing information obtained from the ROM part 5 to the external through a terminal T0. Thereby, a test or an inspection can be attained in accordance with the contents of the specification change of the specification changeable internal circuit 1 by previously forming a text program capable of changing the flow of a test/inspection in accordance with the specification changing information obtained from the terminal T0. Consequently, it is unnecessary to form a test program every time changing the specification of the internal circuit 1.


Inventors:
IMAMIZU JIYUNICHI
Application Number:
JP15651288A
Publication Date:
January 10, 1990
Filing Date:
June 23, 1988
Export Citation:
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Assignee:
NIPPON ELECTRIC IC MICROCOMPUT
International Classes:
G06F11/22; G06F15/78; (IPC1-7): G06F11/22; G06F15/78
Attorney, Agent or Firm:
Uchihara Shin