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Title:
SIGNAL GENERATOR AND TEST APPARATUS USING THE SAME
Document Type and Number:
Japanese Patent JP2011164039
Kind Code:
A
Abstract:

To provide a signal generator where noise is reduced.

An optional waveform generator 100 supplies an analog test signal Sout to a DUT 2. An output amplifier 18 amplifies an analog test signal Sin. A low-pass filter 4 filters an output signal S12 of an output amplifier 18, and removes noise. A first resistor R1 is disposed in series on a signal route of the subsequent stage of the low-pass filter 4. The input matched impedance Zi of the low-pass filter 4 is substantially matched with an output matched impedance Ro of the circuit block of the preceding stage. An output matched impedance Zo of the low-pass filter 4 is sufficiently higher than the input matched impedance Zi.


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Inventors:
KAWABATA MASAYUKI
UEKUSA KOICHIRO
HOSAKA TOMOYA
Application Number:
JP2010029710A
Publication Date:
August 25, 2011
Filing Date:
February 15, 2010
Export Citation:
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Assignee:
ADVANTEST CORP
International Classes:
G01R31/28
Domestic Patent References:
JPH08162809A1996-06-21
JP2002214292A2002-07-31
JP2007017230A2007-01-25
JPH0581753U1993-11-05
JP2005354446A2005-12-22
JPH1138097A1999-02-12
JPH08162809A1996-06-21
Attorney, Agent or Firm:
Sakaki Morishita
Yusuke Murata
Tomoyuki Miki
Masaki Taiki



 
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