Title:
スラグ層厚さ又はスラグ層厚さと溶融金属層表面レベル位置測定方法及びその測定装置
Document Type and Number:
Japanese Patent JP5124894
Kind Code:
B2
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JPS5964512 | [Title of the device] Surface shape measuring device |
JPH05346337 | LIQUID LEVEL DETECTOR |
Inventors:
Kazuharu Hanasaki
Hiroshi Iwamura
Terauchi Yukio
Teruaki Kajikawa
Hiroshi Iwamura
Terauchi Yukio
Teruaki Kajikawa
Application Number:
JP2001157959A
Publication Date:
January 23, 2013
Filing Date:
May 25, 2001
Export Citation:
Assignee:
Heraeus Electronite Co., Ltd.
International Classes:
G01F23/24; C21C5/46; F27B3/08; F27B3/10; F27D21/00
Domestic Patent References:
JP54019427A | ||||
JP60188818A | ||||
JP51023414A | ||||
JP2000088632A | ||||
JP4078525U | ||||
JP9145450A | ||||
JP11030545A | ||||
JP5614171B2 |
Attorney, Agent or Firm:
Takao Yanagino