Title:
SPECTROSCOPY MEASUREMENT DEVICE AND DEVICE FOR ESTIMATING EMISSION WAVELENGTH OF LIGHT EMITTER
Document Type and Number:
Japanese Patent JP2018132308
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide means to measure a wavelength component of light released from a specific light emitter even in a state where a large number of light emitters are smaller than and arranged in an observation visual field of a spectrometer.SOLUTION: A spectroscopy measurement device comprises a spectrometer for measuring a wavelength component of light emitted from a light emitter having a fluorescence emission property, an excitation light irradiation portion for irradiating the light emitter having the fluorescence emission property with an excitation light, and an excitation light irradiation range limitation portion for limiting a range of irradiation with the excitation light radiated from the excitation light irradiation portion. In the excitation light irradiation range limitation portion, the range of the irradiation with the excitation light is limited so as to be narrower than a measurement range of the measuring which the spectrometer can perform.SELECTED DRAWING: Figure 1
Inventors:
MURATA HIROYUKI
Application Number:
JP2017023813A
Publication Date:
August 23, 2018
Filing Date:
February 13, 2017
Export Citation:
Assignee:
TORAY ENG CO LTD
International Classes:
G01J9/00; G01J3/443; G01M11/00; H01L33/00
Domestic Patent References:
| JPH09210784A | 1997-08-15 | |||
| JP2016180733A | 2016-10-13 | |||
| JP2015010834A | 2015-01-19 | |||
| JP2017011100A | 2017-01-12 | |||
| JP2003052624A | 2003-02-25 |
Foreign References:
| US20080191149A1 | 2008-08-14 |