Title:
SPECTRUM MEASUREMENT SYSTEM AND SPECTRAL LINE WIDTH MEASURING METHOD
Document Type and Number:
Japanese Patent JP2015224952
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a spectrum measurement device and a measuring method thereof that enable a spectral line width to be measured with good reproducibility without requiring particular adjustment even if fluctuations occur in a polarization plane of a laser beam when light made incident passes through a delay optical fiber in the spectrum measurement device.SOLUTION: There is provided a spectrum measurement system for measuring a spectral line width from results of spectrum analysis of beat signals. In the spectrum measurement system, a polarization scrambler for randomizing polarization conditions of a passing-through laser beam is connected between an output side of a delay optical fiber and an input side of an optical directional coupler.
Inventors:
OIKAWA MASAHIRO
AOKI CHIKAO
AOKI CHIKAO
Application Number:
JP2014109654A
Publication Date:
December 14, 2015
Filing Date:
May 28, 2014
Export Citation:
Assignee:
OPTOHUB KK
International Classes:
G01J9/04
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