Title:
SPECTRUM MEASUREMENT SYSTEM AND SPECTRAL LINE WIDTH MEASURING METHOD
Document Type and Number:
Japanese Patent JP2015224953
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a spectrum measurement device and a measuring method thereof that enable a spectral line width to be measured with good reproducibility without requiring particular adjustment even if fluctuations occur in a polarization plane of a laser beam when light made incident passes through a delay optical fiber in the spectrum measurement device.SOLUTION: There is provided a spectral line width measuring method of measuring a spectral line width from results of spectrum analysis of beat signals, using a self-delay heterodyne method of a laser beam. The spectral line width measuring method includes a step of making a laser beam from a laser light source incident on an optical directional coupler after randomizing polarization conditions of the laser beam by a polarization scrambler.
Inventors:
OIKAWA MASAHIRO
AOKI CHIKAO
AOKI CHIKAO
Application Number:
JP2014109672A
Publication Date:
December 14, 2015
Filing Date:
May 28, 2014
Export Citation:
Assignee:
OPTOHUB KK
International Classes:
G01J9/04
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