Title:
気流型分析システムの標準試料作成方法
Document Type and Number:
Japanese Patent JP6727722
Kind Code:
B2
Abstract:
An object of the invention is to improve uniformity of a standard sample used for evaluating a gas flow type analysis system. The invention is characterized by including: weighing a background 1 into a container J1; adding a sample solution 2 to the background 1; drying the sample solution 2; adding a solvent 4 that can dissolve the sample into the container J1; and drying the solvent added to the container J1. The invention is also characterized in that the solvent 4 is an organic solvent, in particular, acetone.
Inventors:
Yasuaki Takada
Kumano Shun
Masuyuki Sugiyama
Hisashi Nagano
Tatsuo Nojiri
Hiroki Mizuno
Yuichiro Hashimoto
Kumano Shun
Masuyuki Sugiyama
Hisashi Nagano
Tatsuo Nojiri
Hiroki Mizuno
Yuichiro Hashimoto
Application Number:
JP2016231763A
Publication Date:
July 22, 2020
Filing Date:
November 29, 2016
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G01N1/00; G01N1/28
Domestic Patent References:
| JP2015132607A | ||||
| JP2013083472A |
Foreign References:
| US6470730 |
Other References:
MACCREHAN, William ,Development of SRM 2907 Trace Terrorist Explosives Simulants for the Detection of Semtex and Triacetone Triperoxide,analytical chemistry,米国,American Chemical Society,2011年10月17日,p.9054-9059,URL,https://doi.org/10.1021/ac201967m
木村 匡志、 中野 和彦、 中村 利廣,有害元素蛍光X線分析用粉末状ポリエチレン標準物質の開発,分析化学(Bunseki Kagaku),日本,日本分析化学会,2008年,Vol.57, No.6 (2008),P411-415
(社)日本粉体工業技術協会 JIS Z 8901 試験用粉体 1 説明書,日本,(社)日本粉体工業技術協会,2010年 1月 6日,p.1-49,URL,http://appie.or.jp/wordpress/wp-content/uploads/2014/11/1JIS-1-20141106.pdf
木村 匡志、 中野 和彦、 中村 利廣,有害元素蛍光X線分析用粉末状ポリエチレン標準物質の開発,分析化学(Bunseki Kagaku),日本,日本分析化学会,2008年,Vol.57, No.6 (2008),P411-415
(社)日本粉体工業技術協会 JIS Z 8901 試験用粉体 1 説明書,日本,(社)日本粉体工業技術協会,2010年 1月 6日,p.1-49,URL,http://appie.or.jp/wordpress/wp-content/uploads/2014/11/1JIS-1-20141106.pdf
Attorney, Agent or Firm:
Isono International Patent and Trademark Office