Title:
構造物解析装置、構造物解析システムおよび構造物解析方法
Document Type and Number:
Japanese Patent JP6866717
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a structure analyzer, a structure analysis system and a structure analysis method for analyzing the ground or a structure from a temporal change of vibration data.SOLUTION: This structure analyzer 70 comprises: an acquisition unit 16 for acquiring the outputs of a first inertia sensor and a second inertia sensor installed on the ground or in a structure; and an analysis unit 56 for dividing the outputs into a first frequency domain and a second frequency domain, calculating a first output ratio RL of the output between the first inertia sensor and the second inertia sensor in the first frequency domain, calculating a second output ratio RH of the output between the first inertia sensor and the second inertia sensor in the second frequency domain, and analyzing the ground or the structure from a temporal change of the first output ratio RL and the second output ratio RH.SELECTED DRAWING: Figure 1
Inventors:
Kenta Sato
Kazuyoshi Takeda
Kazuyoshi Takeda
Application Number:
JP2017057143A
Publication Date:
April 28, 2021
Filing Date:
March 23, 2017
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G01M7/02; G01M5/00
Domestic Patent References:
| JP11006840A | ||||
| JP2016095242A | ||||
| JP7128182A | ||||
| JP2003042892A | ||||
| JP2008116333A |
Foreign References:
| US20110041611 |
Attorney, Agent or Firm:
Kazuaki Watanabe
Satoshi Nakai
Hiroki Matsuoka
Satoshi Nakai
Hiroki Matsuoka