Title:
SUPERLARGE INTEGRATED CIRCUIT
Document Type and Number:
Japanese Patent JPS5513895
Kind Code:
A
Abstract:
The very large scale integrated circuit VLSI) is provided with an integral test circuit. The test circuit includes a counter (3), a combination circuit (4) and a number of selection switches (51-54, 5p). The circuit is used to multiplex a small number of test pads to provide testing facilities for the associated integrated circuit. Pref. the test circuit contains a shift register, by whose parallel outputs the selection switches are, controlled, which are connected to the test points. Pref. a delay circuit is connected to the reset input of the counter.
Inventors:
HANSU REINAA
BERUNAA AUTO
BERUNAA AUTO
Application Number:
JP6758879A
Publication Date:
January 31, 1980
Filing Date:
June 01, 1979
Export Citation:
Assignee:
ITT
International Classes:
G01R31/3185; H01L21/66; G01R31/28; H01L21/822; H01L27/04; (IPC1-7): G01R31/26; H01L21/66