Title:
SURFACE DEFECT INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP3405118
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a surface defect inspection device which can inspect a coated surface to be inspected for deft with high accuracy even when the surface to be inspected is a large curved surface.
SOLUTION: A light emitting means 3 for inspection is constituted of tabular transparent members 9 having prescribed lengths, a light source 13 which inputs light into the members 9 through one cut side of the members 9, and prescribed reflecting surface members 15 longer than the members 9. The front and rear surfaces of the members 9 are coated with reflecting members 17 which reflect light and the members 9 and reflecting surface members 15 are alternately lamented upon another by turning up the members 9 and in one end each in the length direction and the light source 13 is positioned near one end sections of the members 9.
Inventors:
Katsuichi Ono
Sei Kubota
Yoshihiro Sanka
Akira Ishii
Naoki Chiba
Sei Kubota
Yoshihiro Sanka
Akira Ishii
Naoki Chiba
Application Number:
JP9011897A
Publication Date:
May 12, 2003
Filing Date:
March 25, 1997
Export Citation:
Assignee:
Suzuki Motor Corporation
International Classes:
G01N21/88; G06T1/00; G01B11/30; G06T7/00; (IPC1-7): G01B11/30; G01N21/88
Domestic Patent References:
| JP4204314A | ||||
| JP62100903A | ||||
| JP476503A | ||||
| JP8222896A | ||||
| JP62273066U |
Attorney, Agent or Firm:
Isamu Takahashi
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