Title:
TEMPERATURE DETECTION CIRCUIT
Document Type and Number:
Japanese Patent JP3358459
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To enable accurate setting of the hysteresis width for overheat detection by when an overheat is detected, bypassing a second constant current, passed through a second current supply element, to a current path other than a diode.
SOLUTION: When the voltage of the anode of a diode 1 for temperature detection falls below a reference voltage Vref and thus an overheat is detected, a second constant current Ib, which flows from a supply voltage VD to the diode 1 for temperature detection through a second constant current supply element 7, is made to flow directly to a ground potential (i.e., the cathode-side potential of the diode 1 for temperature detection) by means of a transistor 13, so that the current ID passing through the diode 1 for temperature detection will be reduced. Thereby it is possible to set the hysteresis for overheat detection, without connecting any additional resistance component to the current path to the diode 1 for temperature detection and thus the width of the hysteresis is set with high accuracy.
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Inventors:
Junichi Nagata
Junji Hayakawa
Hiroyuki Ban
Junji Hayakawa
Hiroyuki Ban
Application Number:
JP24221996A
Publication Date:
December 16, 2002
Filing Date:
September 12, 1996
Export Citation:
Assignee:
株式会社デンソー
International Classes:
G01K7/01; G01R19/165; G05F3/02; H02H5/04; H02H7/20; (IPC1-7): H02H5/04
Domestic Patent References:
| JP7134070A | ||||
| JP1175615A | ||||
| JP6121452A |
Attorney, Agent or Firm:
Tsutomu Adachi
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