TEST AND MEASUREMENT SYSTEM AND NEURAL NETWORK UTILIZATION METHOD

Title:

TEST AND MEASUREMENT SYSTEM AND NEURAL NETWORK UTILIZATION METHOD

Document Type and Number:

Japanese Patent JP2023103994

Kind Code:

A

Abstract:

To allow TDECQ values to be predicted while the creation of training data sets is simplified.SOLUTION: A test and measurement system 42 receives signal waveforms from a plurality of devices under test or waveform simulators, collects a set of training waveforms, processes the set to a set of noise-free training waveforms, uses this as a training data set, and trains a machine learning system 52 to predict a TDECQ value. Separately, the test and measurement system generates a noise correction factor based on noise removed from the set of training waveforms. At run time, the system generates the predicted TDECQ value based on the waveforms from the devices under test, then compensates this for effects of the noise using the noise correction factor, and generates a final TDECQ value.SELECTED DRAWING: Figure 3

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Inventors:

SUN WENZHENG
PAVEL R ZIVNY

Application Number:

JP2023004488A

Publication Date:

July 27, 2023

Filing Date:

January 16, 2023

Export Citation:

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Assignee:

TEKTRONIX INC

International Classes:

G01R13/20

Attorney, Agent or Firm:

Hiroshi Arafune
Yoshio Arafune

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