TEST METHOD OF MEMORY CIRCUIT - NIPPON TELEGRAPH & TELEPHONE

Title:

TEST METHOD OF MEMORY CIRCUIT

Document Type and Number:

Japanese Patent JPS5379329

Kind Code:

A

Abstract:

PURPOSE: To reduce a capacitor of registers at memory circuit test considerably by inibiting comparison between the output of a tested memory circuit and expectation data only when comparison inhibition data exists in both of a column register and a row register.

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Inventors:

NARUMI NAOAKI
OOGUCHI OSAMU
ISHIKAWA KOUJI

Application Number:

JP15494876A

Publication Date:

July 13, 1978

Filing Date:

December 24, 1976

Export Citation:

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Assignee:

NIPPON TELEGRAPH & TELEPHONE

International Classes:

G11C29/00; G06F11/22; G11C29/44; (IPC1-7): G11C29/00

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