Title:
TEST METHOD FOR SEMICONDUCTOR STORAGE DEVICE, AND SEMICONDUCTOR STORAGE DEVICE
Document Type and Number:
Japanese Patent JP2016152054
Kind Code:
A
Abstract:
PURPOSE: To provide a test method for semiconductor storage devices, and a semiconductor storage device with which it is possible to carry out a highly reliable test on the semiconductor storage device.CONSTITUTION: A semiconductor storage device in which n memory cells for storing n bits of data are connected to each word line and which is externally accessed in m bit units is tested by first to third test processes. In the first test process, (n-m) bits of dummy data having a fixed bit pattern is written into (n-m) memory cells among the n memory cells. In the second test process, m bits of test data are written into m memory cells among the n memory cells. Then, in the third test process, only the m bits of test data from among n bits of data obtained by simultaneously reading data from each of the n memory cells are outputted to the outside of the semiconductor storage device.SELECTED DRAWING: Figure 4
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Inventors:
SAKUMA SHINZO
Application Number:
JP2015030564A
Publication Date:
August 22, 2016
Filing Date:
February 19, 2015
Export Citation:
Assignee:
LAPIS SEMICONDUCTOR CO LTD
International Classes:
G11C29/42; G11C11/22; G11C29/34
Domestic Patent References:
| JP2001023394A | 2001-01-26 | |||
| JPH0668700A | 1994-03-11 | |||
| JPH01260699A | 1989-10-17 |
Attorney, Agent or Firm:
Motohiko Fujimura
Shinji Takano
Shinji Takano