Title:
TEST SYSTEM FOR PERIPHERAL DEVICE
Document Type and Number:
Japanese Patent JP3177423
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To simplify the operation by transferring a device test command as a part of a device command from a host device to a peripheral device.
SOLUTION: A host device 1 is provided with a device test processing part 14 which transfers the device test command as a part of the device command from the host device 1 to a peripheral device 5, and the peripheral device 5 is tested in accordance with this device test command. Consequently, it is unnecessary to operate switches on the operator panel of the peripheral device 5. A device information transfer processing part 57 transfers the device command from the host device 1 to the peripheral device to acquire the device information of the peripheral device 5 to be tested, and this device information is stored in a storage device 16 of the host device 1. A device information storage processing part 15 uses stored device information to eliminate a need of acquiring the device text command information from the peripheral device 5 again when the same peripheral device 5 is tested, thus shortening the execution time for device information acquisition to improve the operability.
Inventors:
Shinobu Yamamoto
Application Number:
JP25436295A
Publication Date:
June 18, 2001
Filing Date:
October 02, 1995
Export Citation:
Assignee:
PFU Co., Ltd.
International Classes:
G06F11/30; G06F11/22; (IPC1-7): G06F11/22
Domestic Patent References:
| JP6238993A | ||||
| JP593648A | ||||
| JP392952A | ||||
| JP4205034A | ||||
| JP62293445A |