Title:
TESTING APPARATUS
Document Type and Number:
Japanese Patent JP2008076197
Kind Code:
A
Abstract:
To accurately test the threshold of a transistor.
A testing apparatus connects the output of an operational amplifier 18 to the gate of a testing object transistor 14, and allows the source of the testing object transistor 14 to negatively feed back to a negative input end of the operation amplifier 18. The testing device allows the operational amplifier 18 to operate and perform a test to make the current flowing fixed in value, in the testing object transistor 14 so that the current quantity flowing in a resistor 24 becomes fixed, by applying a desired voltage from DAC 16 to a positive input end of the operational amplifier 18.
Inventors:
MAEKAWA YUICHI
Application Number:
JP2006255063A
Publication Date:
April 03, 2008
Filing Date:
September 20, 2006
Export Citation:
Assignee:
EASTMAN KODAK CO
International Classes:
G01R31/26; H01L29/786
Attorney, Agent or Firm:
Kenji Yoshida
Jun Ishida
Jun Ishida