To provide a testing device and a method for a semiconductor integrated circuit having high practicality and versatility.

This testing device 2 for the semiconductor integrated circuit has functions described as follows: a test program transmitted from HC 18 is sorted into test condition setting data and test circuit construction data, and stored in DRAM 22 and a flash memory 23 respectively; a desired test circuit 19 is constructed in FPGA 13 based on the test circuit construction data; an inspection waveform signal is generated by an inspection waveform signal generation circuit 30 and outputted to DUT 20 based on the test condition setting data; an output waveform signal outputted from the DUT 20 relative to the inspection waveform signal is compared with a theoretical value by a comparison circuit 31, to thereby determine quality of DUT 20 operation; and a determination result is transmitted to the HC 18.