Title:
振動試験装置
Document Type and Number:
Japanese Patent JP7240340
Kind Code:
B2
Abstract:
To provide a vibration test device capable of dealing with a test pattern composed of vibrations including frequencies from a low frequency to a high frequency.SOLUTION: A vibration test device according to the present invention comprises: a vibration target generation device 1 that generates a target waveform r; a controller 2 that includes a sensor signal acquisition device 2b; a vibration unit 11 that vibrates a test object; and a sensor S04 that is provided in the vibration unit 11. The controller 2 comprises: an FB control calculation unit C01 that calculates a control input based on a difference between the target waveform r and a response waveform y acquired by the sensor signal acquisition device 2b from the sensor S04; and an FF control calculation unit C02 that calculates a control input based only on the target waveform r. The FF control calculation unit C02 comprises: a first compensating unit C02a that operates for a frequency which is equal to or lower than a frequency ωp at which a phase can be advanced without increasing a gain; and a second compensating unit C02b that operates at a frequency at which the gain is 0 dB and which is equal to or higher than a lowest frequency ω2 used in a high frequency test.SELECTED DRAWING: Figure 2
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Inventors:
Shinji Ishihara
Koichi Tahara
Koji Hironaka
Koichi Tahara
Koji Hironaka
Application Number:
JP2020012149A
Publication Date:
March 15, 2023
Filing Date:
January 29, 2020
Export Citation:
Assignee:
Hitachi Industrial Products, Ltd.
International Classes:
G05B11/32; G01M7/02; G05B11/36; G05B13/02
Domestic Patent References:
| JP2008102127A | ||||
| JP2008233075A | ||||
| JP60207909A |
Attorney, Agent or Firm:
Polar Patent Attorney Corporation
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