To provide a method and apparatus that allow a liquid to be substantially contained between a lens and a wafer table assembly of an immersion lithography system.
In one embodiment of this invention, an exposure apparatus includes the lens and wafer table assembly. The wafer table assembly has a top surface, and is arranged to support a wafer to be moved with respect to the lens as well as at least one component. The top surface of the wafer and the top surface of the component are each at substantially a same height as the top surface of the wafer table assembly. An overall top surface of the wafer table assembly which includes the top surface of the wafer, the top surface of the wafer table assembly, and the top surface of the at least one component is substantially planar.
JP2005003799 | SUCTION MECHANISM FOR PHOTOSENSITIVE PLATE MEMBER AND IMAGE RECORDING APPARATUS |
JPH10270302 | SUBSTRATE HEAT-TREATING DEVICE |
JP2000340489 | ALIGNMENT DETECTING METHOD |
TAKAIWA HIROAKI
JPH11260686A | 1999-09-24 | |||
JPH10303114A | 1998-11-13 | |||
JPH07220990A | 1995-08-18 | |||
JPH06124873A | 1994-05-06 | |||
JPH04305917A | 1992-10-28 | |||
JPH10154659A | 1998-06-09 | |||
JPH11260686A | 1999-09-24 | |||
JPH10303114A | 1998-11-13 | |||
JPH07220990A | 1995-08-18 | |||
JPH06124873A | 1994-05-06 | |||
JPH04305917A | 1992-10-28 |
Tadashi Takahashi
Kazuya Nishi
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