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Title:
WEAK LIGHT DETECTOR HAVING CHARGE RESETTING MEANS
Document Type and Number:
Japanese Patent JP3760240
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a weak light detector that has a charge resetting means for releasing a charge accumulated in a circuit without increasing an input capacity and can measure the number of photons.
SOLUTION: In the weak light detector including a substrate having an integration type reading circuit including a photo detecting means and a field effect transistor (FET), and a charge resetting means for releasing charges accumulated in the integration type reading circuit, the photo detection means is either a PIN photodiode or an avalanche photodiode (APD), the charge resetting means has a rotary mechanism, a probe that is rotated as the rotary mechanism is rotated, and a connection section for connecting the probe to the outside.


Inventors:
Mikio Fujiwara
Masahide Sasaki
Makoto Akiba
Application Number:
JP2003272470A
Publication Date:
March 29, 2006
Filing Date:
July 09, 2003
Export Citation:
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Assignee:
National Institute of Information and Communications Technology
International Classes:
G01J1/44; G01J1/42; H01L27/144; H01L27/15; H01L31/10; H01L31/105; H01L31/107; H03F3/08; (IPC1-7): G01J1/44; G01J1/42; H01L31/10; H03F3/08
Domestic Patent References:
JP2003149047A
JP7012947A
JP9089652A
Attorney, Agent or Firm:
Hiroshi Kobayashi
Eiji Katayama
Junko Kobayashi
Takayuki Hirose