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Title:
WET TYPE DETACHABLE SILICON-CONTAINING ANTIREFLECTION AGENT
Document Type and Number:
Japanese Patent JP2017020000
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a silicon-containing antireflection material having desired etching selectivity during pattern transfer used for a process using a plurality of layers with a mask for pattern transfer and capable of easily being removed by a wet type chemical treatment.SOLUTION: There is provided a siloxane polymer containing one or more first monomer represented by the formula (1) and a dimer thereof and one or more second monomer represented by the formula (2) or a dimer thereof as polymerization units. There is provided a siloxane polymer, where ≥30% of polymer containing the monomer contain one or more functional part selected from hydroxy, mercapto, epoxy, glycidyloxy or the like and no monomer of the formula HSiX3 and SiX4 as a polymerization unit. R2SiX2(1) RSiX3(2), where R is each independently aryl, aralkyl, alkyl, alkenyl, aralkyl or R, one or more R is R, Ris a C2 to 30 organic group containing one or more -C(O)-O-C(O)- part and each X is a hydrolyzable part.SELECTED DRAWING: None

Inventors:
OWENDI ONGAYI
CHARLOTTE CUTLER
LI MINGQI
YAMADA SHINTARO
JAMES CAMERON
Application Number:
JP2016111352A
Publication Date:
January 26, 2017
Filing Date:
June 02, 2016
Export Citation:
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Assignee:
ROHM & HAAS ELECT MAT
International Classes:
C08G77/14; C08L83/06; G03F7/11
Domestic Patent References:
JP2009019093A2009-01-29
JP2009079219A2009-04-16
JP2009265595A2009-11-12
JP2010039051A2010-02-18
JP2010039056A2010-02-18
JP2012123391A2012-06-28
JP2013117722A2013-06-13
JP2015055876A2015-03-23
JPH03100021A1991-04-25
Foreign References:
WO2013031985A12013-03-07
WO2014126013A12014-08-21
WO2014080908A12014-05-30
WO2016052268A12016-04-07
Attorney, Agent or Firm:
Patent Business Corporation Sender International Patent Office