Title:
X-RAY ANALYZER
Document Type and Number:
Japanese Patent JP3654568
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an X-ray analyzer in which a sample is easy to observe when the sample is observed optically, in which a system peak disturbing a measurement is not generated and in which desired X-rays can be analyzed precisely and with good accuracy.
SOLUTION: In this X-ray analyzer, a sample chamber 11 in which a sample 12 is arranged and an X-ray irradiation chamber 7 which passes primary X-rays (a) shone at the sample 12 and in which a detector 14 used to detect secondary X-rays (b) generated when the primary X-rays (a) irradiate the sample 12 is arranged are divided by an X-ray transmitting diaphragm 10, and the inside of the X-ray irradiation chamber 7 is set to a vacuum state. The diaphragm 10 is reinforced by a reinforcing member 25 which is composed of a resin which does not contain elements from Na up to U.
Inventors:
Sumito Osawa
Shintaro Komatani
Shintaro Komatani
Application Number:
JP14273799A
Publication Date:
June 02, 2005
Filing Date:
May 24, 1999
Export Citation:
Assignee:
HORIBA, Ltd.
International Classes:
G01N23/223; (IPC1-7): G01N23/223
Domestic Patent References:
| JP8015187A | ||||
| JP5142398A | ||||
| JP3035774B2 | ||||
| JP7333117A |
Attorney, Agent or Firm:
Hideo Fujimoto