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Title:
X-RAY FLUOROSCOPIC APPARATUS
Document Type and Number:
Japanese Patent JP2005308599
Kind Code:
A
Abstract:

To provide an X-ray fluoroscopic apparatus capable of enhancing positioning precision in each axial direction by sharing motions along the two axial directions orthogonal each other on an X-ray optical axis plane to change a fluoroscopic position for a fluoroscopic measuring object, by an object holding part, and an X-ray irradiation device and an X-ray image receiving part, and capable of restraining a cost from increasing.

The motion along a y-axis direction is carried out by the object holding part 3, and the motion along an x-axis direction is carried out by the X-ray irradiation device 1 and the X-ray image receiving part 2, out of the x- and y-axis directions orthogonal each other on the plane orthogonal to an X-ray optical axis, one of x-axis-directional moving mechanisms in the X-ray irradiation device 1 and the X-ray image receiving part 2 serves as a feedback control mechanism using an output from a position detecting means 17, and the other works as open loop control. An optical axis guide 6 is provided in either of the X-ray irradiation device 1 and the X-ray image receiving part 2, deviation amounts of the center lines in the X-ray irradiation device 1 and the X-ray image receiving part 2 are found based on an area of a shadow of the optical axis guide 6 appeared in an X-ray fluoroscopic image, so as to be supplied for correction or the like of positional information on the X-ray fluoroscopic image.


Inventors:
TOTTORI YUKINORI
Application Number:
JP2004127575A
Publication Date:
November 04, 2005
Filing Date:
April 23, 2004
Export Citation:
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Assignee:
SHIMADZU CORP
International Classes:
G01N23/04; (IPC1-7): G01N23/04
Attorney, Agent or Firm:
河▲崎▼ 眞樹