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Patent Searching and Data


Title:
X線検査装置
Document Type and Number:
Japanese Patent JP7199996
Kind Code:
B2
Abstract:
To provide an X-ray inspection device in which friction resistance received by an inspected object when passing through a shield curtain is small, and a package of a product is hardly damaged.SOLUTION: An X-ray inspection device 1 has: a housing 2; transportation means 3; an X-ray irradiation unit 4; an X-ray detection unit 5; and a shield curtain 10 whose upper end is supported by a support shaft 11 (Fig.1). On an upstream side of a lower end of the shield curtain, a roller 15 is rotatably provided via a roller shaft 16. When an inspected object being transported pushes the shield curtain, the shield curtain is lifted up as the lower end oscillates toward a downstream side and the inspected object passes through the lower end of the shield curtain and moves to the downstream. The roller of the shield curtain rolls along a front surface of the inspected object. Friction resistance between the inspected object and the roller is small and a package of the inspected object is hardly damaged.SELECTED DRAWING: Figure 3

Inventors:
Kengo Yamaguchi
Application Number:
JP2019027586A
Publication Date:
January 06, 2023
Filing Date:
February 19, 2019
Export Citation:
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Assignee:
Anritsu Co., Ltd.
International Classes:
G01N23/04; G01N23/18; G21K1/00; G21K5/00; G21K5/02
Domestic Patent References:
JP2018004487A
JP5224558A
JP2012528397A
JP2008281416A
JP4303698A
JP2012225666A
JP2015087361A
JP2002228601A
JP2016095204A
JP2003270174A
JP2014092410A
Foreign References:
US7050536
WO2014061461A1
Attorney, Agent or Firm:
Nishimura Norimitsu
Noriyuki Suzuki