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Title:
INSPECTION METHOD OF SOLAR CELL MODULE
Document Type and Number:
Japanese Patent JP2016059164
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a simple method of quantitatively obtaining a local change of a wiring of a PV module.SOLUTION: For quantitatively evaluating local degradation of a wiring of a PV module, an IR image is used. By deriving a formula to associate a local temperature obtained from the IR image and a local resistance, the local resistance is obtained from the IR image.SELECTED DRAWING: Figure 17

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Inventors:
FUJIMORI MASASHIGE
KONO TORU
Application Number:
JP2014183393A
Publication Date:
April 21, 2016
Filing Date:
September 09, 2014
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
H02S50/15
Domestic Patent References:
JP2009032743A2009-02-12
JP2012156343A2012-08-16
JP2013239629A2013-11-28
JP2002329879A2002-11-15
Foreign References:
US20120203494A12012-08-09
Attorney, Agent or Firm:
Aoritsu patent business corporation



 
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